Process Capability (Cp, Cpk)

Measures how well a process fits its specification. Paste raw measurements or enter summary statistics to get Cp, Cpk, Pp, Ppk, Cpm, expected and observed PPM, and Z.bench, with a histogram and fitted normal curves. Within-subgroup sigma uses the AIAG convention: R̄/d₂ for subgroups and MR̄/d₂ for individuals.

Inputs

Input mode

Separate values with spaces, commas, tabs, or new lines. Subgroups are consecutive blocks of the subgroup size. The example is a laser-scribe line width in µm: 20 subgroups of 5, spec 50 ± 6 µm.

per subgroup

Enter 1 for individual measurements; σ within then comes from the average moving range.

Specification

Results

Cpk within—
Cp—
CPL · CPU—
Ppk overall—
Pp—
Ppk 95 % confidence interval— Bissell's approximation, based on the sample size.
Cpm Taguchi—
Expected PPM, within— —
Expected PPM, overall— —
Observed PPM out of spec— —
Z.bench within · overall—
Mean · N—
σ within— —
σ overall—

Distribution vs. specification

How the capability indices are calculated

Capability indices compare the specification width with the spread of the process. The potential indices Cp and Pp ignore where the process is centered. The performance indices Cpk and Ppk use the distance from the mean to the nearer limit:

\[ C_p = \frac{USL - LSL}{6\,\sigma_w}, \qquad C_{pk} = \min\!\left(\frac{USL - \bar{x}}{3\,\sigma_w},\ \frac{\bar{x} - LSL}{3\,\sigma_w}\right) \]

Pp and Ppk use the same expressions with the overall standard deviation \(\sigma_o\) in place of \(\sigma_w\). With a one-sided specification, only CPU (or CPL) exists, and Cpk equals it. Cp and Pp are undefined.

The two standard deviations come from different estimators:

\[ \sigma_w = \frac{\bar{R}}{d_2(n)} \ \text{(subgroups)}, \qquad \sigma_w = \frac{\overline{MR}}{1.128} \ \text{(individuals)}, \qquad \sigma_o = \sqrt{\frac{\sum (x_i - \bar{x})^2}{N-1}} \]

Here \(\bar R\) is the average subgroup range and \(\overline{MR}\) the average moving range of consecutive points. \(d_2\) is the bias-correction constant for the expected range of \(n\) normal values (2.326 for \(n = 5\)). The Taguchi index \(C_{pm} = (USL - LSL)/\bigl(6\sqrt{\sigma_o^2 + (\bar x - T)^2}\bigr)\) also penalizes distance from the target.

Expected nonconforming parts per million come from the normal model, \(\text{PPM}_{USL} = 10^6\,\Phi\!\left(\frac{\bar x - USL}{\sigma}\right)\). Z.bench, \(Z_\text{bench} = -\Phi^{-1}(p_\text{total})\), is the one-sided z-value that would give the same total fraction out of specification.

Cpk versus Ppk

The AIAG SPC manual separates inherent variation (within subgroups, collected over a short time) from total variation (every measurement, including drift and shifts between subgroups). Cpk uses within-subgroup variation and describes what the process could do if special causes were eliminated. Ppk uses total variation and describes what the customer actually received during the study.

For a stable process the two are nearly equal. When Ppk is clearly below Cpk, there are shifts between subgroups: tool wear, lot changes, warm-up, or set-up differences. That is a stability problem to fix before quoting capability.

What counts as capable

CpkDistance to nearest limitExpected PPM (centered, two-sided)Typical interpretation
1.003σ2700Barely capable; any drift produces scrap
1.334σ63Common minimum for ongoing production
1.675σ0.57Common requirement for new or safety/critical characteristics
2.006σ0.002Six Sigma capability (short-term)

For initial process studies, the AIAG PPAP manual's acceptance criteria are commonly applied as follows. An index above 1.67 meets the criteria. Values from 1.33 to 1.67 may be acceptable with customer approval. Values below 1.33 do not meet them. Customer-specific requirements always take precedence.

Worked example

The default data are 100 measurements of a laser-scribe line width, in 20 subgroups of 5, with specification 50 ± 6 µm. The mean is 50.93 µm. The average range is \(\bar R = 2.992\) µm, so \(\sigma_w = 2.992/2.326 = 1.286\) µm. The overall standard deviation is 1.293 µm.

\[ C_p = \frac{56 - 44}{6 \times 1.286} = 1.56, \qquad C_{pk} = \frac{56 - 50.93}{3 \times 1.286} = 1.31 \]

The spread alone would support Cpk ≈ 1.56, but the mean sits 0.93 µm above target, so Cpk = 1.31 is just short of 1.33. About 40 PPM is expected above the USL. Re-centering the process at 50.0 µm, for example with a laser-power or focus offset, would raise Cpk to 1.56 and cut the expected nonconforming rate to about 3 PPM, without any reduction in variation. Ppk (1.31) is close to Cpk, which suggests the process was stable during the study. The 95 % interval for Ppk, roughly 1.11–1.50, is a reminder that 100 values pin the index down only to about ±0.2.

Assumptions and limits

References

  1. AIAG, Statistical Process Control (SPC) Reference Manual, 2nd ed. (2005).
  2. AIAG, Measurement Systems Analysis (MSA) Reference Manual, 4th ed. (2010).
  3. AIAG, Production Part Approval Process (PPAP), 4th ed. (2006).
  4. D. C. Montgomery, Introduction to Statistical Quality Control, 8th ed., Wiley.
  5. A. F. Bissell, “How reliable is your capability index?” Journal of the Royal Statistical Society, Series C (Applied Statistics) 39(3), 331–340 (1990).